Vortex dynamics in superconducting transition edge sensors

S. Ezaki; K. Maehata; N. Iyomoto; T. Asano; B. Shinozaki

doi:10.1063/1.5013624

Vortex dynamics in superconducting transition edge sensors

S. Ezaki
, K. Maehata
, N. Iyomoto
, T. Asano
, B. Shinozaki

Faculty of Fukuoka Medical Technology

Research output: Contribution to journal › Article

3 Scopus citations

Abstract

The temperature dependence of the electrical resistance (R-T) and the current-voltage (I-V) characteristics has been measured and analyzed in a 40 nm thick Ti thin film, which is used as a transition edge sensor (TES). The analyses of the I-V characteristics with the vortex-antivortex pair dissociation model indicate the possible existence of the Berezinskii-Kosterlitz-Thouless (BKT) transition in two-dimensional superconducting Ti thin films. We investigated the noise due to the vortices' flow in TESs. The values of the current noise spectral density in the TESs were estimated by employing the vortex dynamics caused by the BKT transition in the Ti thin films. The estimated values of the current noise spectral density induced by the vortices' flow were in respectable agreement with the values of excess noise experimentally observed in the TESs with Ti/Au bilayer.

Original language	English
Journal	Journal of Applied Physics
Volume	123
Issue number	8
DOIs	https://doi.org/10.1063/1.5013624
State	Published - 28 Feb 2018

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@article{eed4ea4228e2427697bb0b5b1a8d94d1,

title = "Vortex dynamics in superconducting transition edge sensors",

abstract = "The temperature dependence of the electrical resistance (R-T) and the current-voltage (I-V) characteristics has been measured and analyzed in a 40 nm thick Ti thin film, which is used as a transition edge sensor (TES). The analyses of the I-V characteristics with the vortex-antivortex pair dissociation model indicate the possible existence of the Berezinskii-Kosterlitz-Thouless (BKT) transition in two-dimensional superconducting Ti thin films. We investigated the noise due to the vortices' flow in TESs. The values of the current noise spectral density in the TESs were estimated by employing the vortex dynamics caused by the BKT transition in the Ti thin films. The estimated values of the current noise spectral density induced by the vortices' flow were in respectable agreement with the values of excess noise experimentally observed in the TESs with Ti/Au bilayer.",

author = "S. Ezaki and K. Maehata and N. Iyomoto and T. Asano and B. Shinozaki",

year = "2018",

month = feb,

day = "28",

doi = "10.1063/1.5013624",

language = "英語",

volume = "123",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "8",

}

TY - JOUR

T1 - Vortex dynamics in superconducting transition edge sensors

AU - Ezaki, S.

AU - Maehata, K.

AU - Iyomoto, N.

AU - Asano, T.

AU - Shinozaki, B.

PY - 2018/2/28

Y1 - 2018/2/28

N2 - The temperature dependence of the electrical resistance (R-T) and the current-voltage (I-V) characteristics has been measured and analyzed in a 40 nm thick Ti thin film, which is used as a transition edge sensor (TES). The analyses of the I-V characteristics with the vortex-antivortex pair dissociation model indicate the possible existence of the Berezinskii-Kosterlitz-Thouless (BKT) transition in two-dimensional superconducting Ti thin films. We investigated the noise due to the vortices' flow in TESs. The values of the current noise spectral density in the TESs were estimated by employing the vortex dynamics caused by the BKT transition in the Ti thin films. The estimated values of the current noise spectral density induced by the vortices' flow were in respectable agreement with the values of excess noise experimentally observed in the TESs with Ti/Au bilayer.

AB - The temperature dependence of the electrical resistance (R-T) and the current-voltage (I-V) characteristics has been measured and analyzed in a 40 nm thick Ti thin film, which is used as a transition edge sensor (TES). The analyses of the I-V characteristics with the vortex-antivortex pair dissociation model indicate the possible existence of the Berezinskii-Kosterlitz-Thouless (BKT) transition in two-dimensional superconducting Ti thin films. We investigated the noise due to the vortices' flow in TESs. The values of the current noise spectral density in the TESs were estimated by employing the vortex dynamics caused by the BKT transition in the Ti thin films. The estimated values of the current noise spectral density induced by the vortices' flow were in respectable agreement with the values of excess noise experimentally observed in the TESs with Ti/Au bilayer.

U2 - 10.1063/1.5013624

DO - 10.1063/1.5013624

M3 - 記事

SN - 0021-8979

VL - 123

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 8

ER -

Vortex dynamics in superconducting transition edge sensors

Abstract

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