Peeling prevention by SiO layer for far-infrared filter consisting of Ge/Na3AlF6

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We found the effect of peeling prevention by SiO layer on the Na3AlF6 ultra-thick film constituting the far-infrared filter (Ge/Na3AlF6). Using this filter, the HFC gas imaging was performed with a thermal camera.

Original languageEnglish
Title of host publicationOptical Interference Coatings, OIC 2019
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580583
DOIs
StatePublished - 2019
Externally publishedYes
EventOptical Interference Coatings, OIC 2019 - Santa Ana Pueblo, United States
Duration: 2 Jun 20197 Jun 2019

Publication series

NameOptics InfoBase Conference Papers
VolumePart F162-OIC 2019
ISSN (Electronic)2162-2701

Conference

ConferenceOptical Interference Coatings, OIC 2019
Country/TerritoryUnited States
CitySanta Ana Pueblo
Period2/06/197/06/19

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